|
|
Jan 28, 2025
|
|
2022-2023 Undergraduate and Graduate Bulletin (with addenda)
|
ECE-GY 6493 Design and Test of Digital Systems3 Credits Logic simulation methods, structural hazards; Manufacturing test fundamentals, fault modeling and simulation, automatic test pattern generation algorithms; Enhancing testability of digital systems: Design for testability; Advanced testing techniques: Test data compaction and compression techniques; Integrated circuits vs System-on-A-Chip (SOC) design styles and their manufacturing test implications.
|
|
|