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Dec 21, 2024
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2014-2016 Undergraduate and Graduate Bulletin (without addenda) [ARCHIVED CATALOG]
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ME-GY 6323 Microscopy & Microanalysis3 Credits
Foundations of materials characterization. theory of scanning electron microscopy. Practical aspects, data collection, and imaging using Scanning Electron Microscope (SEM). Theory of X-ray Diffraction (XRD). Quantitative and qualitative phase analysis of materials using XRD. X-ray emission and chemical analysis using EDS. Sample preparation for SEM, EDS and XRD observations. Data analysis, image/data processing and data interpretation of electron microscopy and XRD spectra.
Prerequisite(s): Prerequisite: Graduate standing
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